Manufacturing Test Guidelines for the EFR32#

Note: This section replaces AN700.1: Manufacturing Test Guidelines for the EFR32. Further updates to this application note will be provided here.

Most customers have standard product manufacturing test flows, but some do not incorporate RF testing. Manufacturing Test Overview provides a high-level overview of the product tests flow and phases – prototype testing, characterization testing, low-volume manufacturing, and high-volume manufacturing. This document’s goal is to provide the finer details of these test phases and Silicon Labs’ recommended best practices for manufacturing test. This document is intended for Silicon Labs customers developing for the EFR32 product family and who are moving from the early prototype development stage to the manufacturing production environment.

Key Points#

• Test flow

• Test definitions

• Test recommendations

• Test architecture and equipment

• Embedded software tools