About Crystal Tolerances#

The precision of the system crystal in a radio system, such as the Z-Wave radio system, is vital. If the transmitters and receivers in the Radio system are not operating with the correct clock frequency, and if the frequency difference between the parts is large, it will affect the obtainable range between the parts. This leads to customers experiencing a bad performance of the radio system. It is therefore mandatory to make sure that the system frequency of a radio product is as accurate as possible and adheres to the specifications of the radio protocol used, in this case, the Z-Wave protocol.

The total tolerance of a crystal is a sum of three contributions:

  1. Initial tolerances

  2. Temperature tolerances

  3. Aging tolerances

For the Z-Wave protocol, the required tolerances for the crystal after five years of operation is ±27 ppm.

To avoid frequency harmonics in any Z-Wave frequency band, only a 39 MHz crystal is supported. The crystal requirements for EFR32ZG14 and EFR32ZG23 are provided in the table below.

Chipset

Frequency

Total Tolerance

Load Capacitance (CL)

Shunt Capacitance (C0)

ESR

EFR32ZG14

39 MHz

±27 ppm

6-12 pF

Typically 2-3 pF

Max. 60 Ω

EFR32ZG23

39 MHz

±27 ppm

10 pF

Typically 2-3 pF

Max. 60 Ω

The recommended crystal parts for EFR32ZG14 and EFR32ZG23 are provided in the table below.

Chipset

Crystal Manufacturer

Crystal Part Number

ESR (Ω)

C0 (max) (pF)

Temp (°C)

Temp Tolerance (ppm)

Mfg Tolerance (ppm)

Aging (ppm)

CL (pF)

Footprint (mm)

EFR32ZG14

TXC

8Y39072002

35

1

-40 to +95

±13

±7

±2

10

2.0 x 1.6

EFR32ZG23

Tai-Saw

TZ3541C

35

2

0 to +50

±16

±8

±3

10

2.0 x 1.6

Note: The crystal parts in this table are the ones used for validation and characterization of the specific Z-Wave devices. However, both parts meet the crystal requirements for EFR32ZG14 and EFR32ZG23 (see the table above). Therefore, both can be used with any of these Z-Wave devices. List of alternative crystal parts can be found in Second Source Crystal Components.

The Initial tolerances are affected by:

  • Parasitic load capacitance at the crystal component connections

  • Parasitic load of the Z-Wave SoC

  • Pressure exerted on the component package

The Temperature tolerances are affected by:

  • The temperature of the environment

The Aging tolerances are affected by:

  • Overdrive of the crystal

  • Overheat of the component

  • Mechanical stress due to normal usage

If it is assumed that the crystal is not stressed in any way, not mechanically nor electrically, there are two parameters left, which can give a tolerance change for the crystal, i.e., change the frequency of the crystal. These parameters are: the parasitic load capacitance added by the PCB of the product and the differences of the load capacitance of the crystal oscillators for the individual Z-Wave SoCs.

Depending on the implementation of the crystal oscillator circuit of an SoC, external load-caps may be required. However, this is not the case for the EFR32ZG14 or the EFR32ZG23 devices, where the load-caps are integrated on the die of the chipsets, as illustrated in the figure below:

External vs. Internal Load CapacitanceExternal vs. Internal Load Capacitance

The amount of parasitic capacitance seen by the crystal depends on:

  • Trace length

  • PCB material properties

  • Differences in the internal size of the SoC load caps

These parameters vary from product-design to product-design and from Z-Wave SoC to Z-Wave SoC.

To counteract the parasitic load capacitance of the PCB, device implementation, and Z-Wave SoCs, the Z-Wave protocol offers the possibility to adjust the internal load capacitances in such a way that the total capacitance seen by the crystal fulfills the crystal specifications.