Introduction#

Most customers have standard product manufacturing test flows, but some do not incorporate RF testing. This document details the different options for integrating RF testing and characterization into your standard test flows. Manufacturing Test Overview provides a high-level overview of the product tests flow and phases – prototype testing, characterization testing, low-volume manufacturing, and high-volume manufacturing. This document’s goal is to provide the finer details of these test phases, introduction to the test tools available, and Silicon Labs’ recommended best practices for manufacturing test, focusing on the EFR32 family of products. Due to the various options available during prototype testing, this document focuses on the characterization and manufacturing test phases.

Device programming is not discussed in this application note. For information on the programming options available for EFR32 devices, see https://www.silabs.com/products/mcu/programming-options.

If after reading this document you have questions or require assistance with the procedures described, contact a support representative at https://www.silabs.com/support.