LESENSE_ChDesc_TypeDef Struct ReferenceEMLIB > LESENSE
Channel descriptor structure.
Definition at line
760
of file
em_lesense.h
.
#include <
em_lesense.h
>
Data Fields |
|
uint16_t | acmpThres |
LESENSE_ChPinExMode_TypeDef | chPinExMode |
LESENSE_ChPinIdleMode_TypeDef | chPinIdleMode |
uint16_t | cntThres |
LESENSE_ChCompMode_TypeDef | compMode |
bool | enaInt |
bool | enaPin |
bool | enaScanCh |
LESENSE_ChEvalMode_TypeDef | evalMode |
LESENSE_ChClk_TypeDef | exClk |
uint8_t | exTime |
LESENSE_ChIntMode_TypeDef | intMode |
bool | invRes |
uint16_t | measDelay |
LESENSE_ChClk_TypeDef | sampleClk |
uint8_t | sampleDelay |
LESENSE_ChSampleMode_TypeDef | sampleMode |
bool | shiftRes |
bool | storeCntRes |
bool | useAltEx |
Field Documentation
uint16_t LESENSE_ChDesc_TypeDef::acmpThres |
Configure the ACMP threshold or the DAC data. If perCtrl.dacCh0Data or perCtrl.dacCh1Data is set to lesenseDACIfData , acmpThres defines the 12-bit DAC data in the corresponding data register of DAC interface (DACn_CH0DATA and DACn_CH1DATA). In this case, the valid range is: 0-4095 (12 bits). If perCtrl.dacCh0Data or perCtrl.dacCh1Data is set to #lesenseACMPThres, acmpThres defines the 6-bit Vdd scaling factor of ACMP negative input (VDDLEVEL in ACMP_INPUTSEL register). In this case, the valid range is: 0-63 (6 bits).
Definition at line
821
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChPinExMode_TypeDef LESENSE_ChDesc_TypeDef::chPinExMode |
Configure channel pin mode for the excitation phase of the scan sequence. Note: OPAOUT is only available on channels 2, 3, 4, and 5.
Definition at line
773
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChPinIdleMode_TypeDef LESENSE_ChDesc_TypeDef::chPinIdleMode |
Configure channel pin idle setup in LESENSE idle phase.
Definition at line
776
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
uint16_t LESENSE_ChDesc_TypeDef::cntThres |
Configure the decision threshold for the sensor data comparison. Valid range: 0-65535 (16 bits).
Definition at line
832
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChCompMode_TypeDef LESENSE_ChDesc_TypeDef::compMode |
Select the mode for counter comparison.
Definition at line
835
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::enaInt |
Enable/disable channel interrupts after configuring all the sensor channel parameters.
Definition at line
769
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::enaPin |
Set to enable CHx pin.
Definition at line
765
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::enaScanCh |
Set to enable scan channel CHx.
Definition at line
762
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChEvalMode_TypeDef LESENSE_ChDesc_TypeDef::evalMode |
Select the sensor evaluation mode.
Definition at line
839
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChClk_TypeDef LESENSE_ChDesc_TypeDef::exClk |
Select clock used for the excitation timing.
Definition at line
793
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
uint8_t LESENSE_ChDesc_TypeDef::exTime |
Configure the excitation time. Excitation will last exTime+1 excitation clock cycles. Valid range: 0-63 (6 bits).
Definition at line
800
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChIntMode_TypeDef LESENSE_ChDesc_TypeDef::intMode |
Configure the interrupt generation mode for the CHx interrupt flag.
Definition at line
828
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::invRes |
Set to invert result bit stored in the SCANRES register.
Definition at line
786
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
uint16_t LESENSE_ChDesc_TypeDef::measDelay |
Configure the measure delay. Sensor measuring is delayed for measDelay excitation clock cycles. Valid range: 0-127 (7 bits) or 0-1023 (10 bits) depending on device.
Definition at line
810
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChClk_TypeDef LESENSE_ChDesc_TypeDef::sampleClk |
Select clock used for the sample delay timing.
Definition at line
796
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
uint8_t LESENSE_ChDesc_TypeDef::sampleDelay |
Configure the sample delay. Sampling will occur after sampleDelay+1 sample clock cycles. Valid range: 0-127 (7 bits) or 0-255 (8 bits) depending on device.
Definition at line
805
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
LESENSE_ChSampleMode_TypeDef LESENSE_ChDesc_TypeDef::sampleMode |
Select if the ACMP output, the ADC output or the counter output should be used in comparison.
Definition at line
825
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::shiftRes |
Set to enable result from this channel being shifted into the decoder register.
Definition at line
783
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::storeCntRes |
Set to store counter value in the RAM (accessible via RESDATA) and make the comparison result available in the SCANRES register.
Definition at line
790
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
bool LESENSE_ChDesc_TypeDef::useAltEx |
Set to use alternate excite pin for excitation.
Definition at line
779
of file
em_lesense.h
.
Referenced by LESENSE_ChannelConfig() .
The documentation for this struct was generated from the following file:
-
C:/cygwin/home/caamunds/work/super/platform/emlib/inc/
em_lesense.h