LESENSE_ChDesc_TypeDef Struct Reference

Channel descriptor structure.

Definition at line 759 of file em_lesense.h.

#include <em_lesense.h>

Data Fields

uint16_t acmpThres
 
LESENSE_ChPinExMode_TypeDef chPinExMode
 
LESENSE_ChPinIdleMode_TypeDef chPinIdleMode
 
uint16_t cntThres
 
LESENSE_ChCompMode_TypeDef compMode
 
bool enaInt
 
bool enaPin
 
bool enaScanCh
 
LESENSE_ChClk_TypeDef exClk
 
uint8_t exTime
 
LESENSE_ChIntMode_TypeDef intMode
 
bool invRes
 
uint16_t measDelay
 
LESENSE_ChClk_TypeDef sampleClk
 
uint8_t sampleDelay
 
LESENSE_ChSampleMode_TypeDef sampleMode
 
bool shiftRes
 
bool storeCntRes
 
bool useAltEx
 

Field Documentation

uint16_t LESENSE_ChDesc_TypeDef::acmpThres

Configure the ACMP threshold or the DAC data. If perCtrl.dacCh0Data or perCtrl.dacCh1Data is set to lesenseDACIfData, acmpThres defines the 12-bit DAC data in the corresponding data register of DAC interface (DACn_CH0DATA and DACn_CH1DATA). In this case, the valid range is: 0-4095 (12 bits). If perCtrl.dacCh0Data or perCtrl.dacCh1Data is set to lesenseACMPThres, acmpThres defines the 6-bit Vdd scaling factor of ACMP negative input (VDDLEVEL in ACMP_INPUTSEL register). In this case, the valid range is: 0-63 (6 bits).

Definition at line 820 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChPinExMode_TypeDef LESENSE_ChDesc_TypeDef::chPinExMode

Configure channel pin mode for the excitation phase of the scan sequence. Note: OPAOUT is only available on channels 2, 3, 4, and 5.

Definition at line 772 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChPinIdleMode_TypeDef LESENSE_ChDesc_TypeDef::chPinIdleMode

Configure channel pin idle setup in LESENSE idle phase.

Definition at line 775 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

uint16_t LESENSE_ChDesc_TypeDef::cntThres

Configure the decision threshold for the sensor data comparison. Valid range: 0-65535 (16 bits).

Definition at line 831 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChCompMode_TypeDef LESENSE_ChDesc_TypeDef::compMode

Select the mode for counter comparison.

Definition at line 834 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::enaInt

Enable/disable channel interrupts after configuring all the sensor channel parameters.

Definition at line 768 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::enaPin

Set to enable CHx pin.

Definition at line 764 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::enaScanCh

Set to enable scan channel CHx.

Definition at line 761 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChClk_TypeDef LESENSE_ChDesc_TypeDef::exClk

Select clock used for the excitation timing.

Definition at line 792 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

uint8_t LESENSE_ChDesc_TypeDef::exTime

Configure the excitation time. Excitation will last exTime+1 excitation clock cycles. Valid range: 0-63 (6 bits).

Definition at line 799 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChIntMode_TypeDef LESENSE_ChDesc_TypeDef::intMode

Configure the interrupt generation mode for the CHx interrupt flag.

Definition at line 827 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::invRes

Set to invert result bit stored in the SCANRES register.

Definition at line 785 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

uint16_t LESENSE_ChDesc_TypeDef::measDelay

Configure the measure delay. Sensor measuring is delayed for measDelay excitation clock cycles. Valid range: 0-127 (7 bits) or 0-1023 (10 bits) depending on device.

Definition at line 809 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChClk_TypeDef LESENSE_ChDesc_TypeDef::sampleClk

Select clock used for the sample delay timing.

Definition at line 795 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

uint8_t LESENSE_ChDesc_TypeDef::sampleDelay

Configure the sample delay. Sampling will occur after sampleDelay+1 sample clock cycles. Valid range: 0-127 (7 bits) or 0-255 (8 bits) depending on device.

Definition at line 804 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

LESENSE_ChSampleMode_TypeDef LESENSE_ChDesc_TypeDef::sampleMode

Select if the ACMP output, the ADC output or the counter output should be used in comparison.

Definition at line 824 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::shiftRes

Set to enable result from this channel being shifted into the decoder register.

Definition at line 782 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::storeCntRes

Set to store counter value in the RAM (accessible via RESDATA) and make the comparison result available in the SCANRES register.

Definition at line 789 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().

bool LESENSE_ChDesc_TypeDef::useAltEx

Set to use alternate excite pin for excitation.

Definition at line 778 of file em_lesense.h.

Referenced by LESENSE_ChannelConfig().


The documentation for this struct was generated from the following file:
  • C:/HandsOn/super/platform/emlib/inc/em_lesense.h