LESENSE_ChDesc_TypeDef Struct ReferenceEMLIB > LESENSE

Channel descriptor structure.

Definition at line 762 of file em_lesense.h .

#include < em_lesense.h >

Data Fields

uint16_t acmpThres
LESENSE_ChPinExMode_TypeDef chPinExMode
LESENSE_ChPinIdleMode_TypeDef chPinIdleMode
uint16_t cntThres
LESENSE_ChCompMode_TypeDef compMode
bool enaInt
bool enaPin
bool enaScanCh
LESENSE_ChEvalMode_TypeDef evalMode
LESENSE_ChClk_TypeDef exClk
uint8_t exTime
LESENSE_ChIntMode_TypeDef intMode
bool invRes
uint16_t measDelay
LESENSE_ChClk_TypeDef sampleClk
uint8_t sampleDelay
LESENSE_ChSampleMode_TypeDef sampleMode
bool shiftRes
bool storeCntRes
bool useAltEx

Field Documentation

uint16_t LESENSE_ChDesc_TypeDef::acmpThres

Configure ACMP threshold or DAC data. If perCtrl.dacCh0Data or perCtrl.dacCh1Data is set to lesenseDACIfData , acmpThres defines the 12-bit DAC data in the corresponding data register of the DAC interface (DACn_CH0DATA and DACn_CH1DATA). In this case, the valid range is: 0-4095 (12 bits). If perCtrl.dacCh0Data or perCtrl.dacCh1Data is set to #lesenseACMPThres, acmpThres defines the 6-bit Vdd scaling factor of ACMP negative input (VDDLEVEL in ACMP_INPUTSEL register). In this case, the valid range is: 0-63 (6 bits).

Definition at line 823 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChPinExMode_TypeDef LESENSE_ChDesc_TypeDef::chPinExMode

Configure channel pin mode for the excitation phase of the scan sequence. Note: OPAOUT is only available on channels 2, 3, 4, and 5.

Definition at line 775 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChPinIdleMode_TypeDef LESENSE_ChDesc_TypeDef::chPinIdleMode

Configure channel pin idle setup in LESENSE idle phase.

Definition at line 778 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

uint16_t LESENSE_ChDesc_TypeDef::cntThres

Configure decision threshold for sensor data comparison. Valid range: 0-65535 (16 bits).

Definition at line 834 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChCompMode_TypeDef LESENSE_ChDesc_TypeDef::compMode

Select mode for counter comparison.

Definition at line 837 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::enaInt

Enable/disable channel interrupts after configuring all the sensor channel parameters.

Definition at line 771 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::enaPin

Set to enable CHx pin.

Definition at line 767 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::enaScanCh

Set to enable scan channel CHx.

Definition at line 764 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChEvalMode_TypeDef LESENSE_ChDesc_TypeDef::evalMode

Select sensor evaluation mode.

Definition at line 841 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChClk_TypeDef LESENSE_ChDesc_TypeDef::exClk

Select clock used for excitation timing.

Definition at line 795 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

uint8_t LESENSE_ChDesc_TypeDef::exTime

Configure excitation time. Excitation will last exTime+1 excitation clock cycles. Valid range: 0-63 (6 bits).

Definition at line 802 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChIntMode_TypeDef LESENSE_ChDesc_TypeDef::intMode

Configure interrupt generation mode for CHx interrupt flag.

Definition at line 830 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::invRes

Set to invert the result bit stored in SCANRES register.

Definition at line 788 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

uint16_t LESENSE_ChDesc_TypeDef::measDelay

Configure measure delay. Sensor measuring is delayed for measDelay excitation clock cycles. Valid range: 0-127 (7 bits) or 0-1023 (10 bits) depending on device.

Definition at line 812 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChClk_TypeDef LESENSE_ChDesc_TypeDef::sampleClk

Select clock used for sample delay timing.

Definition at line 798 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

uint8_t LESENSE_ChDesc_TypeDef::sampleDelay

Configure sample delay. Sampling will occur after sampleDelay+1 sample clock cycles. Valid range: 0-127 (7 bits) or 0-255 (8 bits) depending on device.

Definition at line 807 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

LESENSE_ChSampleMode_TypeDef LESENSE_ChDesc_TypeDef::sampleMode

Select if ACMP output, ADC output or counter output should be used in comparison.

Definition at line 827 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::shiftRes

Set to enable the result from this channel being shifted into the decoder register.

Definition at line 785 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::storeCntRes

Set to store the counter value in RAM (accessible via RESDATA) and make the comparison result available in the SCANRES register.

Definition at line 792 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

bool LESENSE_ChDesc_TypeDef::useAltEx

Set to use alternate excite pin for excitation.

Definition at line 781 of file em_lesense.h .

Referenced by LESENSE_ChannelConfig() .

The documentation for this struct was generated from the following file:
  • C:/repos/embsw_super_h1/platform/emlib/inc/ em_lesense.h